Date:Thu, 21 Sep 2000 15:33:07 +0200
Reply-To:Jo van Zwaren de Zwarenstein <[log in to unmask]>
Sender:Optics Newsletter <[log in to unmask]>
From:Jo van Zwaren de Zwarenstein <[log in to unmask]>
Subject:Optics-L: French Israel Workshop Nano Characterization of Materi
als Sept 25-26!!!!!
> Ministry of Science, Culture & Sport
> State of Israel
> Ministry of Foreign Affairs Republic of France
> Franco-Israeli Workshop
> Characterization of Materials
> Nano-meter Scale
> The Olive Tree Hotel, Jerusalem, Israel September 25-26, 2000
> The scope of the workshop is to give an overview of the most advanced
> characterization methods that are rarely presented together: electron
> microscopy, X-rays diffraction and scanning probe microscopy. Applications
> will cover particles as well as near-surface and interfaces, and different
> materials ranging from single crystal to soft matter.
> The workshop will present a unique opportunity to update the personal
> knowledge on characterization, to discuss with specialists the application
> of a various methods and to advance the collaboration between Israeli and
> French laboratories.
> A space for discussion, in a poster format, will be available.
> Registration for Posters possible until September 22, 2000.
> A final round table discussion will include issues such as the impact of
> different characterization methods on basic science and on technology, as
> well as teaching and availability of the different methods.
> The workshop is organized and supported by the Israeli Ministry of
> Science, Culture and Sport and by the French Ministry for Foreign Affairs.
> The Tel Aviv University, Faculty of Engineering, Department of Physical
> Electronics, will provide additional support.
> Invited Talks:
> J. Daillant (Universite de Paris-Sud, Orsay):
> Structure and fluctuations of soft matter interfaces
> M. Deutsch (Bar Ilan University, Ramat-Gan):
> The nanoscale study of liquid surfaces and overlayers by x-rays.
> A. Naudon (Universite de Poitiers, Futuroscope, Poitiers):
> Study of the morphology of nanoparticles by grazing-incidence small angle
> X-ray scattering
> Y. Cohen (Technion, Haifa):
> In-situ SAXS-deformation studies on highly ordered block copolymers
> J.P. Morniroli (Universite de Sciences et Technologies de Lille, Lille):
> Application of electron diffraction to nanocrystal structure determination
> W. Kaplan (Technion, Haifa):
> Electron microscopy investigations of nanometer thick crystalline and
> amorphous equilibrium films at metal-ceramic interfaces
> J.M. Penisson (Centre d'Etudes Nucleaire, Grenoble):
> Energy filtered imaging at high resolution: application to grain boundary
> precipitation, segregation and wetting.
> Y. Talmon (Technion, Haifa):
> Nanoscopic imaging of soft condensed matter by digital cryogenic TEM
> G. Dujardin (Universite de Paris-Sud, Orsay):
> Surface molecular reactions studied with the STM
> S. Cohen (Weizmann Institute, Rehovot):
> Surface electronic characterization with SPM
> I. Goldfarb (Tel Aviv University, Tel Aviv):
> In situ STM and RHEED analysis of strain-induced nanostructures on
> surfaces of heteroepitaxial layers
> Y. Menassen (Ben-Gurion University, Beer-Sheva):
> STM investigations of random kinetic surface processes
> T. Epicier (INSA, Lyon):
> Application of electron microscopy (HREM and other methods) to material
> analysis at nanoscale
> A. Loiseau (ONERA, Paris):
> Application of electron microscopy to the study of the structure,
> chemistry and growth of nanotubes.
> B. Bormans (Philips - Electron Optics, Eindhoven, Netherlands):
> Toward aberration free & monochromatic electron microscopy
> Organizing Committee
> Bourret Alain - C.E.A. Grenoble - Co-Chair
> Cohen Sydney - Weizmann Institute
> Deutsch Moshe - Bar Ilan University
> Kaplan Wayne - Technion, Haifa
> Lereah Yossi - Tel Aviv University - Co-Chair
> Rosenfeld Elieser - Ministry of Science, Culture and Sport, Israel
> Shimony Beky - Ministry of Science, Culture and Sport, Israel
> Registration by E-mail:
> Beky Shimony, Conference Secretary,
> Ministry of Science, Culture and Sport:
> [log in to unmask]
> For a detailed program and further information and registration, please
> visit our Web sites: